Rucker Kolls, Inc. Innovative Solutions for ATE Test Interface Products

Cantilever | Multi-site | Butterfly | Blades | Low Leakage | Custom PCB Design | Card Stiffeners/Rings | Specs. | Equip. | Spares

Blades Technology is still used in many of today's applications and often used in high current/voltage applications.

Ceramic Blades

  • Used in sensitive high frequency measurement applications
  • Mechanical and electrical properties can achieve excellent results in low noise, low current, and high temp applications
  • Used for semiconductor, laser applications

Transmission Blades

  • Has an addition of a stripline transmission path which ensures the integrity of the signal
  • Decoupling components can be added to the signal path for electrical enhancements

Metal Blades

  • Still used in many of today’s small pin count applications
  • Are suitable for up to 100MHz
  • Used for semiconductor, hybrid circuit applications

Retract Blades

R&K is leading the way in building and testing the industries parametric probing requirements. Support from nano-amp to single digit femto-amp probecards are available for your specific testing requirements.

R&K is fully Keithley certified and also supports the Agilent platform for parametric testing.

Note:Part of why this parametric probing requirement works is the low leakage epoxy, special probes, layout of the probes, and proprietary cleaning solution along with how you handle the card.


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